Absolute Measurements of the Disintegration Rates of Americium-241 Sources by Using Semiconductor Detectors

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Low geometry α counting and α-particle/γ-ray coincidence counting were made to determine the absolute disintegration rate of an 241Am source. Alpha particles were counted by silicon junction detectors and γ-rays by an NaI (T1) crystal-photomultiplier system. The half life of the 60 keV level of 237Np was measured to check the effect of the coincidence resolving time in the absolute measurement of the americium source by α-γ coin-cidence counting; the half life measured was 6.3×10-8 sec. The mean value of the absolute disintegration rate of a typical 241Am source measured by coin-cidence counting was 1.696×104 dps and the 90% confidence interval for the mean value was [1.679 ×104 dps, 1.713×l04 dps]. Accurate absolute measurements by low geometry a particle counting are very difficult especially for very small semiconductor detectors because of the difficulty of measuring the accurate geometries.
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