Ni内部電極チップコンデンサの電気的特性に及ぼす微量成分の影響
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概要
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Effects of the dopants on the electrical properties of the Ni-electrode multilayer ceramic capacitors have been studied. It is shown that the life time of insulation resistance under Highly Accelerated Life Testing (HALT) become much longer by doping with Y<SUB>2</SUB>O<SUB>3</SUB> or V<SUB>2</SUB>O<SUB>5</SUB> into dielectrics. There are many dislocation loops in the additive-free dielectric and they disappear by doping with Y<SUB>2</SUB>O<SUB>3</SUB>. It is supposed that Y plays the role of donar dopant compensating the oxygen vacancies which have a deleterious effect on the life time under HALT.