A Fault Analytic Method against HB+
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概要
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The search for lightweight authentication protocols suitable for low-cost RFID tags constitutes an active and challenging research area. In this context, a family of protocols based on the LPN problem has been proposed: the so-called HB-family. Despite the rich literature regarding the cryptanalysis of these protocols, there are no published results about the impact of fault analysis over them. The purpose of this paper is to fill this gap by presenting fault analytic methods against a prominent member of the HB-family: HB+ protocol. We demonstrate that the fault analysis model can lead to a flexible and effective attack against HB-like protocols, posing a serious threat over them.
著者
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CARRIJO José
Department of Electrical Engineering, University of Brasilia (UnB)
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TONICELLI Rafael
Department of Electrical Engineering, University of Brasilia (UnB)
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NASCIMENTO Anderson
Department of Electrical Engineering, University of Brasilia (UnB)
関連論文
- A Fault Analytic Method against HB+
- Universally Composable and Statistically Secure Verifiable Secret Sharing Scheme Based on Pre-Distributed Data
- A Novel Probabilistic Passive Attack on the Protocols HB and HB^+
- On the oblivious transfer capacity of the erasure channel
- A Fault Analytic Method against HB^+