A novel gate driving scheme for high power PWM and bypass switches
スポンサーリンク
概要
- 論文の詳細を見る
This paper proposes a new driving scheme for insulated gate bipolar junction transistors (IGBTs) and thyristors used for high power conversion. Most power conversion techniques are based on switching actions so that gate driving scheme and their related circuits have important roles in power conversion. In this paper, fault-tolerant gate driving schemes for power switches and their power supply that utilizes stored energy in the system are presented. Experiments have been carried out with 6500V-rated IGBTs and thyristors to verify the validity of the proposed driving scheme.
著者
-
Lee Dong-Myung
School of Electronic and Electrical Engineering, Hongik University
-
Keister Thomas
JSL, Inc.
-
Seo Jae-Hyeong
MEMS Research and Innovation Center, Qualcomm MEMS Technology
-
Habetler Thomas
School of Electrical and Computer Engineering, Georgia Institute of Technology
-
Harley Ronald
School of Electrical and Computer Engineering, Georgia Institute of Technology
-
Rostron Joseph
Southern States LLC
関連論文
- A novel gate driving scheme for high power PWM and bypass switches
- New internal optimal neurocontrol for a series FACTS device in a power transmission line