A Small Space Radiation Monitor Capable of Measuring Multiple ISD-VGS Values of MOSFET
スポンサーリンク
概要
- 論文の詳細を見る
A small space radiation monitor capable of taking measurements of gate voltages of MOSFET for various drain currents has been developed for flight experiments aboard satellites. Measuring multiple ISD-VGS values of MOSFET is expected to provide better understanding of the electronic response to ionizing radiation in space. In particular, separating the effects of oxide charge densities, interface charge densities, and temperatures is anticipated for the accurate determination of total ionizing dose. Description of the instrumentation for space-borne measurements is given, along with a summary of the anticipated results from this experiment.
著者
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SEON Jongho
Satrec Initiative
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KIM Sung-Joon
Satrec Initiative
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SUNG Baek-Il
Satrec Initiative
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MARRI Salem
Emirates Institute for Advanced Science and Technology
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LEE Sang-Hyun
Satellite Technology Center, Korea Advanced Institute of Science and Technology
関連論文
- A Small Space Radiation Monitor Capable of Measuring Multiple I_-V_ Values of MOSFET
- A Small Space Radiation Monitor Capable of Measuring Multiple ISD-VGS Values of MOSFET