Influence of trapped flux on critical currents of Josephson junctions

スポンサーリンク

概要

• 論文の詳細を見る

• This paper investigates the influence of external field on the distribution of the critical current of Josephson junctions. The external field can cause trapped flux which may reduce the critical current. Experimental results show a formation of bunches in the distribution of the critical current when the external magnetic field rises a certain limit. From a theoretical point of view this formation can only be explained by attractive pinning points in the vicinity of the junction. The Josephson junctions were fabricated with the 1kA/cm2 Nb/Al2O3/Nb trilayer process of FLUXONICS Foundry.

• The Institute of Electronics, Information and Communication Engineersの論文

著者

• Reich Torsten

  Microwave and Characterization Laboratory, IMEP-LAHC, UMR CNRS 5130, University of Savoie

• Ebert Bjoern

  Institute of Information Technology, Ilmenau University of Technology, RSFQ Design Group

• Ortlepp Thomas

  Institute of Information Technology, Ilmenau University of Technology, RSFQ Design Group

• Febvre Pascal

  Microwave and Characterization Laboratory, IMEP-LAHC, UMR CNRS 5130, University of Savoie

• Uhlmann F.

  Institute of Information Technology, Ilmenau University of Technology, RSFQ Design Group

関連論文

• Influence of trapped flux on critical currents of Josephson junctions

スポンサーリンク