Measurement of Edge Localized Mode using Fast Camera in NSTX

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概要

• 論文の詳細を見る

• This paper describes the ELMs measurement by a fast camera in NSTX. The images obtained by the fast camera reveals the ELMs behavior near the divertor region, and the X-point movement can be seen clearly at a first time. The X-point moves inner and down during large ELM. On the other hand the X-point moves up and down during tiny ELM. The difference of these ELMs behavior is also briefly discussed.

• 社団法人 電気学会の論文

著者

• ROQUEMORE Lane

  PPPL

• ZWEBEN Stewart

  PPPL

• Nishino Nobuhiro

  Hiroshima University

• Biewer Theodore

  MIT

• Maqueda Ricardo

  NOVA Photonics Inc.

• Maingi Rajesh

  ORNL

• Bush Charles

  ORNL

• Tritz Kevin

  J. Hopkins University

• Stutman Dan

  J. Hopkins University

関連論文

• 29pB24P NSTXダイバータ : 高速カメラ測定の初期結果(ミラー等)
• Steady-State Operation Scenario and the First Experimental Result on QUEST
• Observation of Simple Helical Structure in Low Aspect Ratio RFP Using Fast Camera
• Measurement of Edge Localized Mode using Fast Camera in NSTX
• Initial Result of Successive SXR Imaging Measurement in Low-A RFP
• Observation of Helical Structure by Imaging Diagnostics in a Low-Aspect-Ratio Reversed Field Pinch
• Design and Initial Result of Time-Resolved Vertical Soft X-Ray Imaging System in Low-A RFP

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