Test Generation for Test Compression Based on Statistical Coding
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概要
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Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.
- 電子情報通信学会(IEICE)の論文
- 2002-10-01
電子情報通信学会(IEICE) | 論文
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