Phase separation and dewetting in polystyrene/poly(vinyl methyl ether) blend thin films in a wide thickness range
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Phase separation and dewetting processes of blend thin films of polystyrene (PS) andpoly(vinyl methyl ether) (PVME) in two phase region have been studied in a wide filmthickness range from 65 μm to 42 nm (~2.5Rg, Rg being radius of gyration of a polymer)using optical microscope (OM), atomic force microscope (AFM) and small-angle lightscattering (LS). It was found that both of the phase separation and dewetting processesdepend on the film thickness, and were classified into four thickness regions. In thefirst region above ~15 μm the spinodal decomposition (SD) type phase separationoccurs in a similar manner to bulk and no dewetting is observed. This region can beregarded as bulk. In the second region between ~15 and ~1 μm, the SD type phaseseparation proceeds in the early stage while the characteristic wavelength of the SDdecreases with the film thickness. In the late stage dewetting is induced by the phaseseparation. In the third region between ~ 1 μm and ~200 nm the dewetting is observedeven in the early stage. The dewetting morphology is very irregular and no definitecharacteristic wavelength is observed. It is expected that the irregular morphology isinduced by mixing up the characteristic wavelengths of the phase separation and thedewetting. In the forth region below ~200 nm the dewetting occurs after a longincubation time with a characteristic wavelength, which decreases with the filmthickness. It is considered that the layered structure is formed in the thin film duringthe incubation period and triggers the dewetting through the capillary fluctuationsmechanism or the composition fluctuations one.
- 2008-01-10
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