Fourier transformed photoreflectance characterization of interface electric fields in GaAs/GaInP heterojunction bipolar transistor wafers
スポンサーリンク
概要
American Institute of Physics (AIP) | 論文
- Oxidation of Si(001) with a hyperthermal O-atom beam at room temperature: Suboxide distribution and residual order structure
- Dual chopped photoreflectance spectroscopy for nondestructive characterization of semiconductors and semiconductor nanostructures
- Vertical-geometry all-optical switches based on InAs/GaAs quantum dots in a cavity
- Narrow-band deep-ultraviolet light emitting device using Al1-xGdxN
- Nonlinear optical properties of silicon nanoclusters/nanocrystals doped SiO2 films: Annealing temperature dependence