CdTe,HgSe,HgTe結晶{100}面上のエッチ・ピットと極性の判定
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概要
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Two types of rectangular etch pits were developed on the {100} surfaces of CdTe, HgSe and HgTe crystals using a suitable etchant. Type-I etch pits were produced only in CdTe crystals and have facets composed of four {111}_B Type-II etch pits appeared in HgSe and HgTe crystals and have facets composed of two {111}_A and two {111}_B From the facet structure of the pit on the {100} surface, polarity of these crystals can easily be identified when they have no polar {111} surface ; the 〈111〉_A direction of these crystals makes an angle of 55° with the normal of the {100} surface in a plane containing both the long side of the rectangular etch pit and the normal of the {100} surface.
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