Laue斑点の固有ひろがり
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概要
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To determine precisely the crystal lattice tilting or twist from the radial length of a Laue spot taken by x-ray micro-beam technique, it is necessary to estimate the proper radial length of the corresponding Laue spot when the crystal is completely free from distortion. A method has been developed to estimate the proper length of the Laue spot, employing "effective area" of the specimen for x-ray diffraction. In this method, the specimen is considered to be composed of a set of parallel lattice planes. It is supposed that those planes exist in the effective area can diffract sufficient x-ray beam to blacken the photographic emulsion. An example of the application to an investigation of the Laue spots from a ZnO crystal taken by x-ray micro-beam technique is illustrated.
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