Defect images by planar ect probe of meader-mesh coils
スポンサーリンク
概要
- 論文の詳細を見る
This paper presents results pertaining to image data obtained from a planar meander-mesh coupled coil type ECT probe. The image data makes it possible to detect not only the existence of a defect but also to extract detailed information regarding the nature of the defect, such as its position, shape, length, and direction. In order to recognize a defect distinctly, we have fabricated the high sensitive planar coil which can be used to image a 2-D representation of the ECT signal. The relationships between the image pattern and defect shape are discussed. © 1996 IEEE.
- IEEEの論文
- 1996-00-00
IEEE | 論文
- Magnetic and Transport Properties of Nb/PdNi Bilayers
- Supersonic Ion Beam Driven by Permanent-Magnets-Induced Double Layer in an Expanding Plasma
- Surfactant Adsorption on Single-Crystal Silicon Surfaces in TMAH Solution: Orientation-Dependent Adsorption Detected by In Situ Infrared Spectroscopy
- Extended-range FMCW reflectometry using an optical loop with a frequency shifter
- Teachingless spray-painting of sculptured surface by an industrial robot