Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability

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概要

• 論文の詳細を見る

• This paper presents a stuck-at fault test data compression using the scan flip flops with delay fault testability namely the Chiba scan flip-flops. The feature of the proposed method is two-stage test data compression. First test data is compressed utilizing the structure of the Chiba scan flip flops (the first stage compression). Second the compressed test data is further compressed by conventional test data compression utilizing X bits (the second stage compression). Evaluation shows that when Huffman test data compression is used in the second stage compression the volume of test data for the proposed test data compression in ATE is reduced 35.8% in maximum 25.7% on average of the one of the test data compressed by the conventional method. The difference of the area overhead of the proposed method from the conventional method is 9.5 percent point.

• 一般社団法人情報処理学会の論文
• 2008-08-27

著者

• Kazuteru Namba

  Chiba University

• Kentaroh Katoh

  Chiba University

• Hideo Ito

  Chiba University

関連論文

• Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability
• Scan FF Reordering for Test Volume Reduction in Chiba-scan Architecture

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