Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining
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概要
- 論文の詳細を見る
Current patent systems face a serious problem of declining quality of patents as the larger number of applications make it difficult for patent officers to spend enough time for evaluating each application. For building a better patent system, it is necessary to define a public consensus on the quality of patent applications in a quantitative way. In this article, we tackle the problem of assessing the quality of patent applications based on machine learning and text mining techniques. For each patent application, our tool automatically computes a score called patentability, which indicates how likely it is that the application will be approved by the patent office. We employ a new statistical prediction model to estimate examination results (approval or rejection) based on a large data set including 0.3 million patent applications. The model computes the patentability score based on a set of feature variables including the text contents of the specification documents. Experimental results showed that our model outperforms a conventional method which uses only the structural properties of the documents. Since users can access the estimated result through a Web-browser-based GUI, this system allows both patent examiners and applicants to quickly detect weak applications and to find their specific flaws.
- 2012-05-15
著者
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Shohei Hido
Tokyo Research Laboratory Ibm Research
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Takashi Imamichi
Analytics & Intelligence Ibm Research - Tokyo
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Shohei Hido
Analytics & Intelligence, IBM Research - Tokyo|Presently with Preferred Infrastructure, Inc.
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Shoko Suzuki
Analytics & Intelligence, IBM Research - Tokyo
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Risa Nishiyama
Analytics & Intelligence, IBM Research - Tokyo
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Rikiya Takahashi
Analytics & Intelligence, IBM Research - Tokyo
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Tetsuya Nasukawa
Analytics & Intelligence, IBM Research - Tokyo
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Tsuyoshi Id?
Analytics & Intelligence, IBM Research - Tokyo
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Yusuke Kanehira
IP Law Department, IBM Japan
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Rinju Yohda
IP Law Department, IBM Japan
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Takeshi Ueno
IP Law Department, IBM Japan
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Akira Tajima
Analytics & Intelligence, IBM Research - Tokyo|Presently with Yahoo! Japan
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Toshiya Watanabe
Research Center for Advanced Science and Technology, The University of Tokyo
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Rinju Yohda
Ip Law Department Ibm Japan
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Akira Tajima
Analytics & Intelligence Ibm Research - Tokyo|presently With Yahoo! Japan
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Shoko Suzuki
Analytics & Intelligence Ibm Research - Tokyo
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Risa Nishiyama
Analytics & Intelligence Ibm Research - Tokyo
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Tsuyoshi Id?
Analytics & Intelligence Ibm Research - Tokyo
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Rikiya Takahashi
Analytics & Intelligence Ibm Research - Tokyo
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Tetsuya Nasukawa
Analytics & Intelligence Ibm Research - Tokyo
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Toshiya Watanabe
Research Center For Advanced Science And Technology The University Of Tokyo
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Takeshi Ueno
Ip Law Department Ibm Japan
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Yusuke Kanehira
Ip Law Department Ibm Japan
関連論文
- Direct Density Ratio Estimation for Large-scale Covariate Shift Adaptation
- Modeling Patent Quality: A System for Large-scale Patentability Analysis using Text Mining