MNS-06 DEVELOPMENT OF VAN DER POL-TYPE SELF-EXCITED FM-AFM : VDP-AFM(Micro/Nanosystem Science and Technology II,Technical Program of Oral Presentations)
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概要
- 論文の詳細を見る
Atomic force microscopy (AFM) is indispensable for studies in nano-biotechnology. The AFM principle is that a micro-cantilever with a probe attached to the tip scans an object's surface to measure its shape. Toward observation of nanometer-scale biological samples in a liquid, this paper reports frequency-modulation atomic force microscopy (FM-AFM). It can avoid collisions by the probe-cantilever with the sample surface and stop oscillation by vibrating the probe-cantilever similarly to van der Pol-type self-excited oscillation.
- 2009-06-17
著者
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Someya Takashi
Mitsubishi Heavy Industries Ltd.
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Kuroda Masaharu
Advanced Manufacturing Research Institute National Institute Of Advanced Industrial Science And Tech
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YABUNO Hiroshi
Department of Mechanical Engineering, Keio University
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Yabuno Hiroshi
Department Of Mechanical Engineering Keio University
関連論文
- MNS-06 DEVELOPMENT OF VAN DER POL-TYPE SELF-EXCITED FM-AFM : VDP-AFM(Micro/Nanosystem Science and Technology II,Technical Program of Oral Presentations)
- Van der Pol-type self-excited microcantilever probe for atomic force microscopy