Microwave Characterization of Copper-Clad Dielectric Laminate Substrates(<Special Section>Recent Technologies for Microwave and Millimeter-wave Passive Devices)

スポンサーリンク

概要

• 論文の詳細を見る

• Microwave measurement methods necessary to characterize copper-clad dielectric laminate substrates are reviewed to realize more precise design of planar circuits: that is, the balanced-type circular disk resonator method for the relative complex permittivity in the normal direction ε_<rn> and tan δ_n, the cavity resonator method and the cut-off waveguide method for one in the tangential direction ε_<rt> and tan δ_t, and the dielectric resonator method for the surface and interface conductivity of copper foil σ_s, and σ_i. The measured results of the frequency and temperature dependences of these parameters are presented for a PTFE substrate and a copper-clad glass cloth PTFE laminate substrate.

• 2007-12-01

著者

• KOBAYASHI Yoshio

  Cooperative Research Center, Saitama University

• Kobayashi Yoshio

  Cooperative Research Center Saitama University

関連論文

• Microwave Characterization of Copper-Clad Dielectric Laminate Substrates(Recent Technologies for Microwave and Millimeter-wave Passive Devices)

スポンサーリンク