Pairwise Test Case Generation Based on Module Dependency(Software Engineering)

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概要

• 論文の詳細を見る

• This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.

• 社団法人電子情報通信学会の論文
• 2006-11-01

著者

• Jung Gihyun

  School Of E.e. Ajou Univ.

• Choi Kyunghee

  Graduate School Of I.c. Ajou Univ.

• Choi Kyunghee

  Graduate School Of I&c Ajou Univ.

• Kim Jangbok

  Graduate School Of I.c. Ajou Univ.

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