Reliability Sampling Plans under Truncated Life Tests with Inverse Gaussian Data(<Special Issue>Contribution to 21 Century Intelligent Technologies and Bioinformatics)

概要

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In this paper, reliability sampling plans for truncated life tests are developed when the lifetimes of test items follow an Inverse Gaussian distribution. The proposed sampling plan can save the test time in practical situations. An algorithm is provided to establish the sampling plans, moreover, some tables are provided for the proposed sampling plans so that the proposed method can be used conveniently for the practitioners. The use of the proposed method is illustrated by examples.
バイオメディカル・ファジィ・システム学会の論文