BINARIZATION TECHNIQUE OF GABOR COEFFICIENT FOR MESH MATERIAL INSPECTION(INTERNATIONAL Workshop on Advanced Image Technology 2008)

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概要

• 論文の詳細を見る

• This paper proposes a statistical model fitting technique in the Gabor coefficient binarization process for inspection of the defects in an electromagnetic wave shield mesh of the plasma display panel (PDP-mesh). The histogram of Gabor coefficient of normal mesh is supposed to be coincidence with Gaussion or Rayleigh distribution depending on the center frequency of the designed Gabor filter. Then the optimal distribution model is decided according to Akaike's Information Criterion (AIC). Experiment results show that the three kinds of defects can be automatically detected in the binary image.

• 社団法人電子情報通信学会の論文
• 2007-12-31

著者

• Wu Di

  Graduate School Of Engineering University Of Fukui

• Sakurai Tetsuma

  Graduate School Of Engineering University Of Fukui

• FUKUMA Shinji

  Graduate School of Engineering, University of Fukui

• OGATA Norihiro

  SEIREN Co., Ltd., JAPAN, Technology Department

• Fukuma Shinji

  Graduate School Of Engineering University Of Fukui

• Ogata Norihiro

  Seiren Co. Ltd. Japan Technology Department

関連論文

• BINARIZATION TECHNIQUE OF GABOR COEFFICIENT FOR MESH MATERIAL INSPECTION(INTERNATIONAL Workshop on Advanced Image Technology 2008)
• Hybrid Parallel Implementation of Inverse Matrix Computation by SMW Formula for Interactive Simulation

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