Electrical properties and tracer diffusion of oxygen in some Bi-based lead-free piezoelectric ceramics
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The relationship between electrical properties and oxygen tracer diffusion was focused for Bi based piezoelectric ceramics including typical perovskite ferroelectrics, (Bi_<1/2>Na_<1/2>)TiO_3 (BNT), and Bi layer-structured ferroelectrics, Bi_4Ti_3O_<12> (BIT). The oxygen tracer diffusion was investigated by secondary ion mass spectrometry, SIMS. Volume diffusion coefficients, D_v, of ^<18>O in Bi excess BNT (BNT+Bi_2O_3 0.3 mass%, BNT-0.3) and V-substituted BIT (Bi_4Ti_<3-x>V_xO_<12>, BITV-x) ceramics were dramatically decreased as compared with those in non-doped ceramics. These results suggest that the concentration of oxygen vacancies decreased. On the other hand, electromechanical coupling factor, k_<33>, for BNT-0.3 and BITV-0.02 ceramics are 0.47 and 0.25, respectively, which are the largest in each system.
- 2008-02-01
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