入力パルスの時間的揺らぎの統計的処理によるTDR法の高精度化

概要

論文の詳細を見る
We examined an improvement of the measurement accuracy of complex permittivity from the TDR method above 1 GHz. In the high frequency region, the accuracy of the complex permittivity strongly depends on the time fluctuation of the input step-pulse, i.e., jitter of the input pulse, and this jitter of the input pulse depends on temperature around the pulse generator. The pulse generator was set in the temperature controlled sealed box to reduce the temperature fluctuation around the pulse generator. The temperature was kept at 23.6±0.03℃, and then we calculated histogram analysis for the reflection time, t_<ref>, of the input pulse from the measurement sample. The histogram of t_<ref> showed two peaks. We observed the reflection pulses from the standard and unknown sample, and calculated histogram analysis of t_<ref> for these reflection pulses. The reflection pulses from standard and unknown samples with t_<ref> showing maximum in each histogram were selected, and the dielectric spectra were calculated from these reflection pulses with higher accuracy.
東海大学の論文