Fault diagnosis of RF analog LSI circuits using guided-probe technique and genetic algorithm

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概要

• 論文の詳細を見る

• Ann efficient method, which can diagnose RF analog circuits without any help from design engineers, has been proposed. It consists of a guided-probe technique for area-level diagnosis and a genetic algorithm for element-level diagnosis.

• 八戸工業高等専門学校の論文
• 2006-12-15

著者

• Kuji Norio

  Department Of Electrical And Computer Engeneering

関連論文

• BS-10-14 Study on Multi-point management and control system for ubiquitous sensor networks(BS-10.Network Planning, Control, and Management,symposium)
• Fault diagnosis of RF analog LSI circuits using guided-probe technique and genetic algorithm

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