Patent analysis: international patent classification and file index & F-term classification (人文科学とコンピュータ)

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概要

• 論文の詳細を見る

• Patent information consists of huge critical technological information. It can be served as a vital index of scientific and economical development as well as a main device in creating and developing a specific technology. This study begins with exploring the basic structure of patent data and further examining the constitution of the International Patent Classification and composition of FI & F-term of Japanese Patent Office (JPO) in great detail.

• 一般社団法人情報処理学会の論文
• 2007-09-27

著者

• Yu Chung-han

  Huafan University

• Liu Chen-yuan

  Tung Nan University Of Technology

• Lin Huang-Cuang

  Tung Nan University of Technology

関連論文

• Patent analysis: international patent classification and file index & F-term classification (人文科学とコンピュータ)

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