Ultraviolet Photon Induced Bulk, Surface and Interface Modifications in n-Hg_<0.8>Cd_<0.2>Te in Hydrogen Environment

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概要

著者

Lee S‐j
Korea Res. Inst. Of Standards And Sci. Daejeon Kor
Lee Hee
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I
Agnihotri O.
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I
Lee Sang-jun
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I
Lee Mm-young
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I
PAL Ravinder
Solid State Physics Laboratory
YANG Keedong
Center for Electro-Optics, Department of Electrical Engineering and Computer Science, Korea Advanced
BAE Soo-Ho
Center for Electro-Optics, Department of Electrical Engineering and Computer Science, Korea Advanced
CHOI Woo
Center for Electro-Optics, Department of Electrical Engineering and Computer Science, Korea Advanced
CHOI Jong
Center for Electro-Optics, Department of Electrical Engineering and Computer Science, Korea Advanced
KATO lsamu
Department of Electronics, information and Communication Engineering and Laboratory for Bio-Science
Bae Soo-ho
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I
Kato Lsamu
Department Of Electronics Information And Communication Engineering And Laboratory For Bio-science A
Yang Keedong
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I
Choi Woo
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I
Choi Jong
Center For Electro-optics Department Of Electrical Engineering And Computer Science Korea Advanced I

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