CMC-07: Stress Analysis of Sapphire Wafers Subjected to Thermal Shocks(CMC-I: CERAMICS AND CERAMECS MATRIX COMPOSITES)

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概要

• 論文の詳細を見る
• 一般社団法人日本機械学会の論文
• 2005-06-19

著者

• ZHANG L.

  The University of Sydney

• Zarudi I.

  The University Of Sydney

• VODENITCHAROVA T.

  The University of Sydney

• YIN Y.

  The University of Sydney

• DOMYO H.

  Peregrine Semiconductor Australia

• HO T.

  Peregrine Semiconductor Australia

関連論文

• CSW-09: Estimation of the Interface Temperature Rise for Polishing PCD Compacts(CSW-II: COATING, SURFACE MODIFICATION AND WEAR)
• CSW-01: On Wear and Tool Life of Tungsten Carbide, PCBN and PCD Cutting Tools(CSW-I: COATING, SURFACE MODIFICATION AND WEAR)
• CMC-07: Stress Analysis of Sapphire Wafers Subjected to Thermal Shocks(CMC-I: CERAMICS AND CERAMECS MATRIX COMPOSITES)

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