A novel technique to measure narrow erase band width(Recording systems & heads (II),The 8th Asian Symposium on Information Storage Technology (ASIST-8))
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概要
- 論文の詳細を見る
We propose a new erase band width (EBW) measurement method by applying the Lin's magnetic write width measurement. From the derivatives of two full-track profiles, an evaluation function was calculated for several trial EBW value. As a result, EBWd is precisely estimated with 10 nanometers resolution.
- 社団法人電子情報通信学会の論文
- 2006-11-02
著者
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MURAOKA Hiroaki
RIEC, Tohoku University
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Aoi Hajime
Riec Tohoku University
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Aoi Hajime
Research Institute Of Electrical Communication Tohoku University
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Miura Kenji
Riec Tohoku University
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MIURA Kenji
Research Institute of Electrical Communication, Tohoku University
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MURAOKA Hiroaki
Research Institute of Electrical Communication, Tohoku University
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NAKAMURA Yoshihisa
Research Institute of Electrical Communication, Tohoku University
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Muraoka Hiroaki
Research Institute Of Electrical Communication Tohoku University
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Nakamura Yoshihisa
Graduate School Of Science And Engineering Ehime University
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Nakamura Yoshihisa
Research Institute Of Electrical Communication Tohoku University
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Muraoka H
Riec Tohoku University
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Nakamura Yoshihisa
Research Institute Of Electrical Communication Tohoku Univeristy
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Nakamura Yasuaki
Graduate School Of Science And Engineering Ehime University
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