大容量半導体素子の等価試験装置の開発

概要

論文の詳細を見る
High-voltage and high-current semiconductor devices such as 8kV-3500A thyristor and 5200V-2000A IGBT are developed and becoming commercially available. It is essential to evaluate and examine the characteristics of the devices before actually apply these devices to the large capacity equipment such as high-voltage dc(HVDC) transmission systems and static Var compensators(SVC). However testing of the devices under the actual circuit configulation requires a lot of cost and power. Then we propose an equivalent test circuit using a simple L-C oscillation circuit. We developed a test circuit capable up to 20kV and 500A and the design concept and brief test results are presented.
津山工業高等専門学校の論文
2006-02-28