Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree(Dependable Computing)

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概要

• 論文の詳細を見る

• A novel concurrent core test approach is proposed to reduce the test cost of SOC. Prior to test, the test sets corresponding to cores under test (CUT) are merged by using the proposed merging algorithm to obtain a minimum merged test set. During test, the proposed scan tree architecture is employed to support the concurrent core test using the merged test set. The approach achieves concurrent core test with one scan input and low hardware overhead. Moreover, the approach does not need any additional test generation, and it can be used in conjunction with general compression/decompression techniques to further reduce test cost. Experimental results for ISCAS 89 benchmarks have proven the efficiency of the proposed approach.

• 社団法人電子情報通信学会の論文
• 2006-03-01

著者

• Zeng Gang

  The Graduate School Of Science And Technology Chiba University

• ITO Hideo

  The Faculty of Engineering, Chiba University

• Ito Hideo

  The Faculty Of Engineering Chiba University

• Ito Hideo

  The Faculty Of Engineering Chiba Unicersity

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• Concurrent Core Testing for SOC Using Merged Test Set and Scan Tree(Dependable Computing)

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