Effects of Backgate Voltage on Electrical Characteristics of Poly-Si Thin Film Transistors Fabricated on Stainless-Steel Substrate
スポンサーリンク
概要
- 論文の詳細を見る
- 2000-12-15
著者
-
Serikawa Tadashi
Ntt Cyber Space Laboratories:(present Address)ntt Electronics Corporation
-
Omata Fujio
Ntt Cyber Space Laboratories
関連論文
- Effects of Backgate Voltage on Electrical Characteristics of Poly-Si Thin Film Transistors Fabricated on Stainless-Steel Substrate
- High-Mobility Poly-Si Thin Film Transistors Fabricated on Stainless-Steel Foils by Low-Temperature Processes Using Sputter-Depositions