Conductivity and Surface Potential Studies in Carbon Films by Conductive Scanning Probe Microscopy
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-06-30
著者
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Sakai Tadashi
Toshiba Corporation Advanced Discrete Semiconductor Technology Laboratory Corporate Research & D
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Sakuma Naoshi
Toshiba Corporation Advanced Discrete Semiconductor Technology Laboratory Corporate Research & D
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Ono Tomio
Toshiba Corporation Advanced Discrete Semiconductor Technology Laboratory Corporate Research & D
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ZHANG Li
Toshiba Corporation, Advanced Discrete Semiconductor Technology Laboratory, Corporate Research & Dev
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Zhang Li
Toshiba Corporation Advanced Discrete Semiconductor Technology Laboratory Corporate Research & D
関連論文
- Conductivity and Surface Potential Studies in Carbon Films by Conductive Scanning Probe Microscopy
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