New Fatigue Model Based on Thermionic Field Emission Mechanism

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概要

• 論文の詳細を見る

• We investigated the mechanism of the fatigue phenomenon in ferroelectric thin films such as Pb(Zr. Ti)O_3 (PZT) and SrBi_2Ta_2O_9 (SBT) The fatigue phenomenon in PZT was successfully explained by a new concept model introducing the effect of impact-ionization and energy distribution of trap levels to thermionic field emissions. This model can also explain the effect of applied voltage and temperature on the fatigue phenomenon. Moreover, we can simulate the fatigue characteristics in SBT by including the energy dissipation effect on the model for PZT. By introducing this result into an extrapolation method, the rewriting limit of ferroelectric thin films can be successfully predicted.

• 社団法人応用物理学会の論文
• 2001-09-30

著者

• TAJIRI MASAYUKI

  Department of Environmental Science, Faculty of Science, Kumamoto University

• Nozawa Hiroshi

  Department Of Energy Science And Technology Graduate School Of Energy Science Kyoto University

• Tajiri Masayuki

  Department Of Energy Science And Technology Graduate School Of Energy Science Kyoto University

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