Mobility of CClF^+_2 in Ar, N_2 and CCl_2F_2(Electrical Properties of Condensed Matter)

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概要

• 論文の詳細を見る

• The ionic mobilities and longitudinal diffusion coefficients of CClF^+_2 in Ar, N_2 and CCl_2F_2 have been measured using a selected-ion drift apparatus. The data were obtained at E/N values ranging from 50 to 140 Td for Ar, 30 to 90 Td for N_2 and 100 to 240Td for CCl_2F_2.

• 社団法人応用物理学会の論文
• 2002-06-15

著者

• Yamada Tadahiko

  Department Of Electrical Engineering Daido Institute Of Technology

• Kondo Yoshitaka

  Department Of Electrical Engineering Daido Institute Of Technology

• FUZISAWA Tatumi

  Department of Electrical Engineering, Daido Institute of Technology

• Fuzisawa Tatumi

  Department Of Electrical Engineering Daido Institute Of Technology

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• Ion Transport Analysis by Extended Wannier Theory : II.Effect of Ion Density Gradient in the Transverse Direction
• Mobility of CClF^+_2 in Ar, N_2 and CCl_2F_2(Electrical Properties of Condensed Matter)
• Pulseless Corona in Negative Point to Plane Gap

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