Minimal Test Set Generation by Hashing for R-Valued PLAs
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概要
- 論文の詳細を見る
For fault diagnosis in R-valued PLAs (R≥2), we construct a test table with rows of test vectors each giving activated product lines and normal output values of the programmed functions. Test vector generation for constructing the test table is based on product-oriented test generation which was proposed by Min and Fujiwara for binary PLAs. The number of test vectors is less than or equal to k・(n・R-1) where k is the number of product lines in an R-valued n variable PLA. The procedure to construct the test table is based on a hash method on the generated tests. By combining tests in the table, fault diagnosis of the PLA can be performed efficiently.
- 日本信頼性学会の論文
- 2005-09-01
著者
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Mukaidono Masao
The Author Is With The Faculty Of Engineering Meiji University Dept. Of Information Science
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Nagata Yasunori
The Author Is With The Faculty Of Engineering University Of The Ryukyus Dept. Of Elect'l &
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MILLER D.
The author is with the Faculty of Engineering, University of Victoria, Dept. of Computer Science
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Miller D.
The Author Is With The Faculty Of Engineering University Of Victoria Dept. Of Computer Science
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Miller D.Michael
The author is with the Faculty of Engineering, University of Victoria, Dept. of Computer Science