Switching Characteristics of Amorphous-Silicon Field-Effect-Transistors
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概要
- 論文の詳細を見る
The Dynamic characteristics of amorphous-silicon field-effect-transistors were investigated. The experimental results showed that just after the input of a pulsed gate voltage, a large drain current flowed through the transistors, and that it decreased gradually to a static value. By using these dynamic characteristics, the switching speed of the transistors was estimated to be 100 times as high as that calculated from the static characteristics.
- 社団法人応用物理学会の論文
- 1981-06-05
著者
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Kawashima Masatoshi
Department Of Occupational Health Graduate School Of Medical Science Kitasato University School Of M
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Kawashima Masatoshi
Department Of Physical Electronics Tokyo Institute Of Technology
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MATUMURA Masakiyo
Department of Physical Electronics, Tokyo Institute of Technology
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Matumura Masakiyo
Department Of Physical Electronics Tokyo Institute Of Technology
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