Small Angle and Very-Small Angle X-Ray Scattering from Amorphous Pd_<80>Si_<20> before and after Cold Work

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概要

• 論文の詳細を見る

• Structure of amorphous pd_<80>Si_<20> and its change after 20% cold forging are examined by means of small angle scattering (SAS) and very-small angle scattering(VSAS) of X-rays. Before the cold work a hump is observed in SAS corresponding to a distance of 40A, and a broadening of transmitted beam is observed in the very-small angle region. The latter is shown not to be due to the refraction but really to the scattering of X-rays. The VSAS corresponds to the radius of gyration of 10^5 A. After cold work the SAS intensities diminish and the VSAS disappears.

• 社団法人応用物理学会の論文
• 1981-04-05

著者

• Kohra Kazutake

  National Laboratory For High Energy Physics

• Suzuki Carlos

  Faculty Of Engineering University Of Tokyo

• DOI Kenji

  Japan Atomic Energy Research Institute

関連論文

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• The Structure Analysis of AuCu_3 by Means of a Fourier Transformation of X-ray Diffuse Scatterings
• X-Ray Topographic Observation of surface Damages in Ion-Irradiated Ionic Crystals
• Rotation of the Electric Vector of the Polarized X-Rays by Diffraction in Crystals

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