Application of Reflection Coefficient Dip to Layer Thickness Measurement by Acoustic Microscope : Ultrasonic Imaging and Microscopy
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1985-09-18
著者
-
Masuda Hitoshi
Central Research Institue Toppan Printing Co. Ltd.
-
Takeuchi Eiji
Central Research Institue Toppan Printing Co. Ltd.
-
TSUKAHARA Yusuke
Central Research Institue, Toppan Printing Co., Ltd.
-
HAYASHI Eisaku
Central Research Institue, Toppan Printing Co., Ltd.
-
TANI Yasuhiro
Institute of Industrial Science, Univ. of Tokyo
-
Tsukahara Yusuke
Central Research Institue Toppan Printing Co. Ltd.
-
Hayashi Eisaku
Central Research Institue Toppan Printing Co. Ltd.
-
Tani Yasuhiro
Institute Of Industrial Science The University Of Tokyo
-
Tani Yasuhiro
Institute Of Industrial Science Univ. Of Tokyo
関連論文
- Application of Reflection Coefficient Dip to Layer Thickness Measurement by Acoustic Microscope : Ultrasonic Imaging and Microscopy
- Correlation of Cutting Area with Cutting Force During Self-Excited Vibration : Vibration, Control Engineering, Engineering for Industry
- Development of High-Concentration Lapping Discs with Low Bonding Strength and their Application to Mirror Finishing of Brittle Materials
- Development of Small Three-component Dynamometer for Cutting Force Measurement
- A Study on On-the-Machine Tool Re-Generation Technology : Process development for grinding tools with rapid baking system(Grinding technology)