Xα_<MT>-SW Calculation of X-Ray Excitation,Ionization, and Anger ElectronEnergies in SiH_4, SiF_4 and SiCl_4 : X-RAY AND XUV ABSORPTION SPECTRA

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文

著者

• Meisel A.

  Sektion Chemie Der Karl-marx-universitat

• SZARGAN R.

  Sektion Chemie der Karl-Marx-Universitat

• HARTMANN E.

  Institut fur Isotopen-und Strahlenforschung

• BRUNNER G.

  Sektion Chemie der Karl-Marx-Universitat

関連論文

• Xα_-SW Calculation of X-Ray Excitation,Ionization, and Anger ElectronEnergies in SiH_4, SiF_4 and SiCl_4 : X-RAY AND XUV ABSORPTION SPECTRA
• Investigation of the Band Structure of Ternary Semiconductors by Means of X-Ray Emission and Photoelectron Spectroscopies : PHOTOEMISSION (MAINLY UPS AND XPS)

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