Scanning Teunneling Microscope Studies on Recovery Processes of Sputter-Induced Surface Defects on Si(111)-7×7
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-06-30
著者
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Ogawa Keiichi
Graduate School Of Integrated Science Yokohama City University
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YONWYAMA Kazuya
Graduate School of Integrated Science, Yokohama City University
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Yonwyama Kazuya
Graduate School Of Integrated Science Yokohama City University:(present Address) Fuji Photo Optical Co. Ltd
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Yoneyama Kazuya
Graduate School of Integrated Science, Yokohama City University:(Present address) Fuji Photo Optical Co., Ltd
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