Control of Etch Slope during Etching of Pt in Ar /Cl_2 /O_2 Plasmas
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1996-04-30
著者
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Jung Chan.
Semiconductor Research And Development Center Samsung Electronics Co. Ltd.
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YOO Won.
Semiconductor Research and Development Center, Samsung Electronics Co. Ltd.
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HAHM Jin.
Semiconductor Research and Development Center, Samsung Electronics Co. Ltd.
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KIM Hyoun.
Semiconductor Research and Development Center, Samsung Electronics Co. Ltd.
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KOH Young.
Semiconductor Research and Development Center, Samsung Electronics Co. Ltd.
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LEE Moon.
Semiconductor Research and Development Center, Samsung Electronics Co. Ltd.
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Yoo W
Samsung Electronics Co. Ltd. Kyungki‐do Kor
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Yoo Won.
Semiconductor Research And Development Center Samsung Electronics Co. Ltd.
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Hahm Jin.
Semiconductor Research And Development Center Samsung Electronics Co. Ltd.
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Lee Moon.
Semiconductor Research And Development Center Samsung Electronics Co. Ltd.
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Kim Hyoun.
Semiconductor Research And Development Center Samsung Electronics Co. Ltd.
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Kim Hyeoung
International Center For Actuators And Transducers Pennsylvania State University
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Koh Young.
Semiconductor Research And Development Center Samsung Electronics Co. Ltd.
関連論文
- Control of Etch Slope during Etching of Pt in Ar /Cl_2 /O_2 Plasmas
- Effects of Conductivity of Polysilicon on Profile Distortion