Material Characterizatiorn and Optimization for Ultrahigh-Speed Metal-Semiconductor-Metal Photodetectors
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概要
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Metal-semiconductor-metal photodetectors fabricated on different epitaxial layers of GaAs are investigated and optimized for applications to high-speed optical transmission systems. The devices exhibit full width at half-maximum (FWHM) times from 1.5 ps to 7 ps corresponding to carrier velocities exceeding 5×10^7 cm/s. In contrast to previously reported results, our results indicate that the use of low doped materials is recommended due to much better linearity and dynamic responsivity.
- 社団法人応用物理学会の論文
- 1995-02-28
著者
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Kowalsky Wolfgang
Department Of Optoelectronics University Of Ulm
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Sickmoller Markus
Department of Optoelectronics, University of Ulm
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Sickmoller Markus
Department Of Optoelectronics University Of Ulm
関連論文
- Heterostructures of Crystalline Organic and Inorganic Semiconduetors for Applications in Optoelectronic Integrated Circuits
- Material Characterizatiorn and Optimization for Ultrahigh-Speed Metal-Semiconductor-Metal Photodetectors
- Wavelength Selective Metal-Semiconductor-Metal Photodetector with Integrated Fabry-Perot Resonator for High Bandwidth Receivers
- Characterization of Dynamic Behaviour of Metal-Semiconductor-Metal Photodeteetors by Correlation Technique