Determination of In-Plane Strain Using a Holographic Modulated Diffraction Grating
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概要
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A method for obtaining a highly-sensitive in-plane strain contour as a two-beam interferogram is devised.Using an optical setup in which an object is illuminated from two directions, deformation of the object is recorded in a form of a holographic modulated diffraction grating (MDG) modulated by the in-plane (x) and out-of-plane (z) components of displacement.Two identical MDGs are introduced into a system which connects two coherent double diffraction systems in series.Two spatial filtering processes are incorporated so that the z-component of displacement is cancelled and the difference between the two x-components inherent in the two MDGs, slightly shifted, forms an interferogram.Then the derivative of the in-plane displacement, i.e.the strain, is contoured in the image plane.In a simple experiment with a bent rectangular beam, the resultant interference pattern agreed well with the theoretical pattern and the amount of strain per fringe space was 3.6×10^<-5>.
- 1979-07-05
著者
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Toyooka Satoru
Department Of Mechanical Engineering Faculty Of Engineering Saitama University
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Toyooka Satoru
Department Of Environmental Science And Human Engineering Graduate School Of Science And Engineering
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