Improved Time-of-Flight Technique for Measuring Carrier Mobility in Thin Films of Organic Electroluminescent Materials
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-03-15
著者
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Tian H
East China Univ. Sci. & Technol. Shanghai Chn
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Zhu W
National Inst. Of Advanced Industrial Sci. And Technol. (aist) Ibaraki Jpn
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CHEN Baijun
Centre Of Super-Diamond and Advanced Films(COSDAF)and Department of Physics and Materials Science, C
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LEE Chun-sing
Centre Of Super-Diamond and Advanced Films(COSDAF)and Department of Physics and Materials Science, C
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LEE Shuit-tong
Centre Of Super-Diamond and Advanced Films(COSDAF)and Department of Physics and Materials Science, C
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WEBB Patrick
Optoelectronics Research Center(ORC)and Department of Electronic Engineering, City University of Hon
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CHAN Yan-cheong
Optoelectronics Research Center(ORC)and Department of Electronic Engineering, City University of Hon
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GAMBLING William
Optoelectronics Research Center(ORC)and Department of Electronic Engineering, City University of Hon
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TIAN He
Institute of Fine Chemicals, East China University of Science and Technology
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ZHU Weihong
Institute of Fine Chemicals, East China University of Science and Technology
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Tian He
Institute Of Fine Chemicals East China University Of Science & Technology
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Chan Yan-cheong
Optoelectronics Research Center(orc)and Department Of Electronic Engineering City University Of Hong
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Zhu W
East China Univ. Sci. And Technol. Shanghai Chn
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Zhu Weihong
Institute Of Fine Chemicals East China University Of Science And Technology
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Chen Baijun
Centre Of Super-diamond And Advanced Films(cosdaf)and Department Of Physics And Materials Science Ci
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Webb Patrick
Ibm Corp. Storage Systems Division
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Webb Patrick
Optoelectronics Research Center(orc)and Department Of Electronic Engineering City University Of Hong
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Lee Chun-sing
Centre Of Super-diamond And Advanced Films(cosdaf)and Department Of Physics And Materials Science Ci
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Lee S‐t
National Chiao Tung Univ. Twn
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Gambling William
Optoelectronics Research Center(orc)and Department Of Electronic Engineering City University Of Hong
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- Improved Time-of-Flight Technique for Measuring Carrier Mobility in Thin Films of Organic Electroluminescent Materials
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