Local Tunneling Barrier Height Imaging on Si(111) Surface (<Special Issue> Scanning Tunneling Microscopy)

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概要

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• We measured the spatial distribution of a local tunneling barrier height by means of the AC height modulation method. We performed this measurement on clean Si(111)7×7 surfaces and the surfaces exposed to O_2 gas. On clean surfaces, 7×7 structures, which are the same as those in topographic images, were observed in the tunneling barrier height mode. It was found that the spatial distribution of local tunneling barrier height was modified along a step. It was also found that the topography and the spatial distribution of local tunneling barrier height were modified by exposure to O_2 gas.

• 社団法人応用物理学会の論文
• 1997-06-30

著者

• Miyao Masahiro

  Muroran Institute Of Technology

• Yonei Kazunori

  Muroran Institute Of Technology

• HORIGUCHI Nobuhiro

  Muroran Institute of Technology

関連論文

• Local Tunneling Barrier Height Imaging on Si(111) Surface ( Scanning Tunneling Microscopy)
• Local Tunneling Barrier Height on Si(111) Reconstructed Surfaces
• Local Tunneling Barrier Height on Si(111) Reconstructed Surfaces

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