FOREWORD (<Special Issue> Scanning Tunneling Microscopy)
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1997-06-30
社団法人応用物理学会 | 論文
- Single Electron Memory Devices Based on Plasma-Derived Silicon Nanocrystals
- Electron Transport in Nanocrystalline Si Based Single Electron Transistors
- Flare in Microlithographic Exposure Tools
- Storage and Lifetime Measurements of Multiply Charged Ions Produced by Synchrotron Radiation
- Optical Modes in Two-dimensionally Ordered Dielectric Spheres