Room-Temperature Characterization of Midgap Level (EL2) in GaAs Diodes without Metallization Processes

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1986-07-20

著者

• Hoshino Minoru

  Faculty Of Technology Tokyo Metropolitan University

• OKUMURA Tsugunori

  Faculty of Technology, Tokyo Metropolitan University

• Okumura Tsugunori

  Faculty Of Technology Tokyo Metropolitan University

• Okumura Tsugunori

  Faculty Of Engineering Tokyo Metropolitan University

関連論文

• Room-Temperature Characterization of Midgap Level (EL2) in GaAs Diodes without Metallization Processes
• Report on the 50th Spring Meeting (2003) of The Japan Society of Applied Physics and Related Societies

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