Fe-Nd-Ti Films with Perpendicular Magnetic Anisotropy
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概要
- 論文の詳細を見る
Fe-Nd-Ti thin films with perpendicular magnetic anisotropy have been prepared by rf sputtering. Though Fe-Nd films has its easy axis of magnetization in the film plane, the addition of Ti to Fe-Nd causes the film to have an easy axis of magnetization in the normal to the film plane. The structure of Fe-Nd-Ti film is detected to be partially crystallized in amorphous alloy matrix.
- 社団法人応用物理学会の論文
- 1984-03-20
著者
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Tsutsumi Kazuhiko
Materials Engineering Laboratory Mitsubishi Electric Co.
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SUGAHARA Hiroshi
Materials and Electronic Devices Laboratory, Mitsubishi Electric Corp.
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Sugahara Hiroshi
Materials Engineering Laboratory Mitsubishi Electric Co.
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Sugahara Hiroshi
Materials And Electronic Devices Laboratory Mitsubishi Electric Corp.
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- Fe-Nd-Ti Films with Perpendicular Magnetic Anisotropy