Measurement of the Temperature Fluctuation in a Resistor Generating 1/f Fluctuation

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概要

• 論文の詳細を見る

• A new method is devised to measure the temperature fluctuation in a current-carrying resistor. The spectrum of the temperature fluctuation is determined from the values of the resistance fluctuation, the variance fluctuation, and their product. It is found to be proportional to f^<1.1> and the temperature fluctuation amounts to 0.13 K^2 in the frequency range of 10^4-10^2 Hz. This agress well with the calculated value of the equilibrium temperature fluctuation in the effective volume generating 1/f noise.

• 社団法人応用物理学会の論文
• 1983-05-20

著者

• Hashiguchi Sumihisa

  Department Of Electronics Engineering Yamanashi University

• Hashiguchi Sumihisa

  Department Of Electronics And Computer Science Faculty Of Engineering Yamanashi University

関連論文

• Measurement of the Temperature Fluctuation in a Resistor Generating 1/f Fluctuation
• Two-dimensional LMS Adaptive Filters

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