Sensing Molecular Density of Monolayers from Fluoroalkyltrichlorosilane Using Atomic Force Microscope Having a Tip Modified with Fluoroalkyltrichlorosilane Molecules

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概要

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• Force curves were measured on monolayers from fluoroalkyltrichlorosilane on silicon substrates using the atomic force microscope (AFM) having a tip which was chemically modified with fluoroalkyltrichlorosilane molecules. Adhesive force arose between the monolayers and the chemically modified AFM tip, and it increased with an increase in the amount of coverage of the monolayers. In contrast, the adhesive force exerted on the unmodified AFM tip was independent of the amount of coverage of the monolayers. These results indicate the AFM with a chemically modified tip can detect the molecular density of the monolayers.

• 社団法人応用物理学会の論文
• 1997-02-01

著者

• Nakagawa Tohru

  The Nakao Laboratory Matsushita Electric Industrial Co. Ltd.

関連論文

• Contact Angle and Atomic Force Microscopy Study of Reactions of n-Alkyltrichlorosilanes with Muscovite Micas Exposed to Water Vapor Plasmas with Various Power Densities
• Sensing Molecular Density of Monolayers from Fluoroalkyltrichlorosilane Using Atomic Force Microscope Having a Tip Modified with Fluoroalkyltrichlorosilane Molecules
• New Method for Fabricating a Mixed Monolayer Using Self-assembly of Trichlorosilanes and Mapping of Different Molecules in the Mixed Monolayer Using a Frictional Force Microscopy with a Tip Chemically Modified with Fluoroalkyltrichlorosilanes

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