The Effects of Reverse Injection Current on High a Quality InSb Photovoltaic Detector
スポンサーリンク
概要
- 論文の詳細を見る
This paper presents the fabrication and characterization of high-quality InSb p+-n photovoltaic detectors. The reverse dark current of the detector at small reverse bias is dominated by the generation-recombination current and shunt current. We also present, for the first time, the effects of the reverse injection current on the detector. The breakdown voltage of the detector increases after the injection process. However, the dark current at small reverse bias(-200 mV) increases and then decreases with increase of the reverse injection current. This result may be due to the hole trapping in the passivation layer during the injection process.
- 社団法人応用物理学会の論文
- 1991-11-01
著者
-
Chen L
National Nano Device Lab. Hsinchu Twn
-
Pang Y
Chung Shan Institute Science And Technology Tao Yuan
-
CHEN Liang
Chung Shan Institute Science and Technology Tao Yuan
-
LUO Jiunn
Chung Shan Institute Science and Technology Tao Yuan
-
LIU Tai
Chung Shan Institute Science and Technology Tao Yuan
-
PANG Yen
Chung Shan Institute Science and Technology Tao Yuan
-
YANG Sheng
Chung Shan Institute Science and Technology Tao Yuan
-
Pang Yen
Chung Shan Institute Science And Technology
-
Yang Sheng
Chung Shan Institute Science And Technology
-
Liu Tai
Chung Shan Institute Science And Technology
-
Luo Jiunn
Chung Shan Institute Science And Technology
-
CHEN Liang
Chung Shan Institute Science and Technology
関連論文
- Ion Beam Etching for InSb Photovoltaic Detector Applications
- The Effects of Reverse Injection Current on High a Quality InSb Photovoltaic Detector